Study of Ring Damage Phenomenon on a Charge Coupled Device (CCD) Irradiated by an Ultrashort Pulsed Laser Beam
T. Jiang and X.A. Cheng
To study the mechanism of ring damage phenomenon of array charged coupled device (CCD) irradiated by an ultrashort pulsed laser beam, the damage morphology of a CCD operated in different states were obtained by adjusting the CCD focal length in the experiment. Experimental results show that the ring damage phenomenon will appear in the state of defocusing. Using the theory of beam propagation and numerical method, the ideal light intensity distribution in the focal plane and along the axis were simulated. It was found that the camera operated in the defocusing state is the main reason of ring damage phenomenon.
Keywords: Laser, charge coupled device (CCD), ultrashort pulse, ring damage phenomenon, defocusing state