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Photothermal measurement of the thermal parameters of volume materials and thin films by the photodeflection method
Kyrill L Muratikov, Aleksei L Glazov, Heinz G Walther

The photodeflection method for thermal parameter measurements of volume materials, thin films, and multilayered structures has been further developed. Experimental and theoretical results of the application of the modified photodeflection method to measurements of materials with different thermal properties are presented. It is shown that the modified photodeflection method provides a lower mean squared error between experimental and theoretical results than the ordinary one in a wide frequency range of thermal waves.

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