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Interface thermal conductance and the thermal conductivity of multilayer thin films
David Cahill, Andrew Bullen, Seung-Min Lee

Accurate and simple measurements of the thermal conductivity of thin films deposited on high thermal conductivity substrates have been recently enabled by the development of an AC hot-wire method, the ω method. Recent progress in the measurement and understanding of heat transport in ultra-thin films (<= 1 μm thick) and multilayers is reviewed, and the possibility of using solid – solid interfaces on nanometer length scales to control heat transport in thin film materials is explored. The finite thermal conductance of solid – solid interfaces becomes important when considering heat transport in single layer films

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