Current limitations of commercial laser flash techniques for highly conducting materials and thin films
André Lindemann, Jürgen Blumm and Martin Brunner
For laser flash measurements on micro-scale materials (e.g., thin films), fast flash sources and fast detector systems are required. This is often related with higher costs and complexity. Using state-of-the-art technology, thin film tests are possible to a certain extend.
Presented in this work are the thermal diffusivity results on various thin film materials. The borderlines for using conventional laser flash techniques on various highly conducting or film materials are discussed. Important improvements on the hardware and software side as well as the advantages of a special in-plane sample holder will be shown.
Keywords: Thermal diffusivity, Thermal conductivity, Thin films, laser flash, highly conducting, lfa, tpp, thermophysical properties.