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A silicon carbide certified reference material for high-temperature thermal diffusivity measurements using a laser flash apparatus
Daeho Kim and Inseok Yang
A reference material made of silicon carbide was certified for thermal diffusivity measurements by using a laser flash apparatus from –50 to 1000 °C. The certified thermal diffusivity value of the certified reference material (CRM) is 5.78 × 10–5 m2·s–1 at –50 °C and decreases to 1.10 × 10–5 m2·s–1 at 1000 °C. In the homogeneity assessment of the CRM, the relative standard deviation of the measured thermal diffusivity across different specimens was less than 1.5% at temperatures from 25 to 1000 °C and 2.4% at –50 °C. Thermal cycling testing via a differential scanning calorimeter demonstrated thermal stability of the material up to 1050 °C over more than 200 thermal cycles. Seven CRM specimens were sent to three testing laboratories to measure their thermal diffusivity values, which were consistently within the combined uncertainty range for the CRM and the testing laboratories. Therefore, the newly developed CRM with demonstrated thermal stability can be used for high-temperature thermal diffusivity measurements using a laser flash apparatus up to 1000 °C.
Keywords: Thermal diffusivity, Laser flash apparatus, Certified reference material, Silicon carbide, High temperature, Differential scanning calorimeter
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DOI: 10.32908/hthp.v51.1265