Studies on Stability of Polymer Thick Film Resistors By Using Pulse Voltage Trimming Method (PVTM)
Poornaiah Billa and Y. Srinivasa Rao
The stability characteristics of both untrimmed and pulse voltage trimmed polymer thick film resistors both in terms of long and short term drifts have been studied by conducting experiments in terms of the percentage variation of resistance, TCR measurements, long term storage test, thermal cycling, humidity test, high voltage test and the effect of grain size and conducting particle composition have been evaluated. It has been found that higher compositions of polymer thick film resistors have shown the smallest variation which can be attributed to the higher composition of insulator.
Keywords: Stability, polymer thick film resistors, aging, thermal cycling, humidity