JAPED HomeIssue Contents

Structural and Optical Properties of Thin Ternary Semiconductor Alloy Cd0.5Zn0.5Te
A. Arbaoui, N. Achargui, F. Miloua, R. Miloua, L. Laanab, A. Mzerd, M. Loghmarti and M. Robino

A higher quality and a nearly stoichiometric composition of Cd0.5Zn0.5Te have been successfully grown on glass substrate by vacuum evaporation technique. The composition and structural studies are investigated by energy dispersive X-ray analysis, SEM, and X-Ray diffraction. Film optical constants are determined from transmittance measurements at normal light incidence in the spectral range (500–2500 nm). The presence of interference fringes and of a sharp absorption edge are indicatives of a very good optical quality. Analysis of the refractive index n (λ), of the induced absorption α (hν) and the determination of the energy bandgap Eg, are then given from the acquisition of the transmission data. Comparison with previous works on films prepared by other techniques confirms a better quality of our films prepared at low cost.

Keywords: Cd0.5Zn0.5Te; Thin films; Ternary semiconducting alloy.

Full Text (IP)