Laser Speckle Intensity and Surface Roughness in Treated Silicon Solar Wafers
R. Thiruneelakkandan and R. Balamurugan
To reduce the reflection and increase the absorption of incident light by photovoltaic devices, Nd: YAG laser treatment is applied to the surfaces of silicon solar wafers to enhance their performance. The sample surfaces are texturized using a pulsed Nd: YAG laser, offering a positive alternative to traditional chemical processing methods. By inducing controlled surface roughness through laser treatment, we observed a significant reduction in reflectivity, leading to increased light absorption and an optimal surface roughness range that maximises solar wafer efficiency. Measurements of speckle pattern contrast provided insights into solar wafer roughness, revealing that increased surface roughness significantly enhances conversion efficiency. Laser texturing is an effective technique for improving the effectiveness of silicon solar wafers, paving the way for advancements in solar energy technology.
Keywords: solar wafer, Nd-YAG pulsed laser, roughness, speckle photography