A Method of Spatial Trap Distribution Estimation in Thin Tetracene Layers
K. Porath, D. Kotowski, M. Obarowska, R. Signerski and J. Godlewski
Photoenhanced current measurements in thin tetracene films deposited on a glass substrate reveal complicated structure of the layers. Illumination of the layer from the substrate (S) side give higher photocurrent densities then from a non-substrate (NS) side where the tetracene layer is much more degenerated. The aim of this paper is the estimation of spatial trap distribution based on photocurrent measurements under the sample illumination from S and NS side of the sample.