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Atomic Force Microscopy in Polymer Studies
H. Kaczmarek

This work presents the recent developments in Atomic Force Microscopy (AFM) applied to polymer studies. The principles of AFM operation and definitions of roughness have been introduced. The main advantages of AFM are pointed out. The morphology and its effect on surface properties of various classes of polymers have been described. The influence of different factors on surface morphology in polymer films, foams, latexes, gels, dispersions, sponges observed by AFM has been shown. Theoretical considerations included in some of the cited literature works confirm conclusions obtained by AFM. The relations between morphology and properties estimated by other analytical methods leads to better understanding numerous physical and chemical phenomena occurring in polymers. This work shows how many, valuable information’s concerning polymers can be obtained with the help of AFM.

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